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ผลงานตีพิมพ์ในวารสารวิชาการQuantitative Analysis of Therapeutic Antibody Interactions with Fcฮณ Receptors Using High-Speed Atomic Force Microscopyผู้แต่ง:Yanaka, S., Watanabe, H., Yogo, R., Dr.MESAYAMAS KONGSEMA, Lecturer, Kondo, S., Yagi, H., Uchihashi, T., Kato, K., วารสาร: |
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ผลงานตีพิมพ์ในวารสารวิชาการTEMPO-Mediated Oxidation of Hemp Bast Holocellulose to Prepare Cellulose Nanofibrils Dispersed in Waterผู้แต่ง:Dr.Buapan Puangsin, Associate Professor, Fujisawa, S., Kuramae, R., Saito, T., Isogai, A., วารสาร: |
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ที่มา:APPLIED MICROBIOLOGY AND BIOTECHNOLOGYหัวเรื่อง:Heterologous expression of polyhydroxyalkanoate depolymerase from Thermobifida sp. in Pichia pastoris and catalytic analysis by surface plasmon resonance |
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ผลงานตีพิมพ์ในวารสารวิชาการPreparation and characterization of magnetic force microscopy tips coated with nickel films by e-beam evaporationผู้แต่ง:Damrongsak, B., Coomkaew, S., Saengkaew, K., Cheowanish, I., Dr.Pongsakorn Jantaratana, Associate Professor, วารสาร: |
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การประชุมวิชาการPreparation and characterization of magnetic force microscopy tips coated with nickel films by e-beam evaporationผู้แต่ง:Damrongsak, B., Coomkaew, S., Saengkaew, K., Cheowanish, I., Dr.Pongsakorn Jantaratana, Associate Professor, การประชุมวิชาการ: |
หัวเรื่อง:ไม่มีชื่อไทย (ชื่ออังกฤษ : Effect of Films Thickness on the Properties of ITO Thin Films Prepared by Electron Beam Evaporation) ผู้เขียน:Artorn Pokaipisit, Mati Horprathum, พิเชษฐ ลิ้มสุวรรณ สื่อสิ่งพิมพ์:pdf AbstractIndium tin oxide (ITO) thin films were prepared on glass slide substrates at various thicknesses by electron beam evaporation (e-beam) from a tablet of In2O3 and SnO2 (9:1). The ITO thin films were fabricated at substrate temperatures of 150 ?C, deposition rate of 2 ?/s and oxygen flow rate of 12 sccm. The structure, surface morphology, electrical and optical properties of ITO thin films were investigated. The structure and surface morphology of films were monitored by using X–ray diffraction (XRD) and atomic force microscopy (AFM), respectively. The optical transmittance and sheet resistance of ITO thin films were measured by spectrophotometer and four-point probe. It was found that transmittance and sheet resistance of ITO thin films on glass slide decreased as film thickness increased from 200 nm to 700 nm. The transmittance spectra in the visible region (400-700 nm) and the sheet resistance decreased from 76.63% to 57.89% and from 16 ?/sq. to 4 ?/sq., respectively, with increasing the films thickness. |
ผลงานตีพิมพ์ในวารสารวิชาการInfluence of rapid thermal annealing on structural, optical and electrical properties of ITO thin filmsผู้แต่ง:Sakulsaknimitr, W., Dr.Worasitti Sriboon, Lecturer, Teanchai, K., Horprathum, M., Chananonnawathorn, C., Patthanasettakul, V., Dr.Wichian Siriprom, Lecturer, วารสาร: |